GB/T 4937.35-2024半导体器件机械和气候试验方法第35部分:塑封电子元器件的声学显微镜检查国家标准
英文:Semiconductor devices—Mechanical and climatic test methods—Part 35: Acoustic microscopy for plastic encapsulated elec...
英文:Semiconductor devices—Mechanical and climatic test methods—Part 35: Acoustic microscopy for plastic encapsulated elec...