GB/T 36053-2018X射线反射法测量薄膜的厚度、密度和界面宽度仪器要求、准直和定位、数据采集、数据分析和报告国家标准
英文:Evaluation of thickness, density and interface width of thin films by X-ray reflectometry—Instrumental requirements, ...
英文:Evaluation of thickness, density and interface width of thin films by X-ray reflectometry—Instrumental requirements, ...